The PIC16F1776 doubles the 1773’s program flash to 14 KB on the same 28-pin package, keeping 1024 bytes of SRAM and the full closed-loop analogue array: three op amps, six high-speed comparators, a seventeen-channel 10-bit ADC, three of each DAC flavour, three ramp generators and three complementary output generators. Fourteen kilobytes is where battery-charger and lighting products add communication on top of the control loop. When protection is engaged, our copy protected PIC16F1776 MCU service recovers the image from hardware you own.

Charger firmware is state, not just loops

Battery-charging products built on this family typically layer a charge-state machine – pre-charge, constant current, constant voltage, termination, fault handling – over the analogue loops, and the state machine’s thresholds and timeouts live in flash tables. A clone that boots and regulates can still terminate charges at the wrong point if a table edge was mis-read, which is why our verification walks the clone and donor through a full charge cycle against a real cell pack, comparing state transitions rather than just voltages. The copy protected PIC16F1776 MCU capture itself follows the family discipline: configuration words mapped first, every answerable region read in its protected state in one pass, per-sector checksums, and the bulk erase – the only documented way to clear protection, at the cost of everything – excluded from the procedure entirely. The 128-byte high-endurance flash block is captured alongside, since charger designs commonly keep cycle counters or serialisation there. Bench reasoning is in the how the MCU memory works guide, and remanence background for older storage in the clone microcontroller memory content remanence reference.

Charge-cycle validation is worth describing precisely, because it is the test most likely to be skipped and most likely to be needed. Our fixture attaches a real cell pack – cycled to a mid-state-of-charge so the transition region is exercised – and logs the clone’s state-machine transitions against the donor’s on the same pack. Termination current, top-off timeout and fault behaviour are compared as events, not as final voltages, which is where table-edge errors actually surface. The event log ships with the image; a customer can rerun it with any cell pack and see the same comparison.

The high-endurance flash block has a specific role on charger products: cycle counting. It is engineered for far more write cycles than ordinary flash, and designs use it for odometers, serialisation and wear-levelling counters that survive firmware updates. Because it is a distinct region with its own endurance class, we capture and restore it separately in every duplication pass – lumping it into the main image has produced clones whose counters reset on the first service update, a defect that usually surfaces months later as a warranty dispute.

Duplication and delivery

Verified images go into matching 28-pin blanks with configuration words and high-endurance block restored, through the MCU flash EEPROM data cloning pipeline with read-back comparison on every unit, and bounded-scope work is on the partial microcontroller chip cloning page.

Dynamic power management is the quiet feature of charger firmware on this part: when the input supply sags, the state machine derates the charge current rather than tripping a fault, and the DPM thresholds are table constants like everything else. A clone with a mis-read DPM entry behaves perfectly on a bench PSU and mis-manages current on a weak adapter – the exact scenario end users report as “slow charging” with no error anywhere. Our charge-cycle test therefore includes a sagging-input segment, and the event log shows both units’ DPM transitions side by side.

Family links

The 7 KB sibling is on the PIC16F1773 binary page, the 40/44-pin members on the PIC16F1777 chip and PIC16F1778 source code recoveries, and the newer 180xx generation on the PIC16F18074 binary page.

Float voltage accuracy after termination is a final checkpoint on charger recoveries: the CV regulation target and its temperature compensation live in flash constants, and drift of even a few tens of millivolts changes cell longevity measurably over a product’s life. Our comparison logs the settled float voltage of both units after a full cycle, not just the termination event.

Scope

We accept only units you own or are authorised to service. Send the locked PIC16F1776 and we will confirm the package, quote a fixed fee, and return a verified image with its charge-cycle validation notes.