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Freescale Automobile SPC5603CK0CLL6 Microprocessor Unlocking
Freescale Automobile SPC5603CK0CLL6 Microprocessor Unlocking is a process to disable the protection over microcontroller spc5603ck0cll6 embedded flash memory content and readout program from mcu spc5603 flash memory;
EMC characterization and optimization are performed at component level with a typical application environment and simplified MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user apply EMC software optimization and prequalification tests in relation with the EMC level requested for his application. Software recommendations – The software flowchart must include the management of runaway conditions in the process of unlocking spc5601pef0v1 microcomputer flash memory such as:
- Corrupted program counter
- Unexpected reset
- Critical data corruption (control registers…)
- Prequalification trials – Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
- Unexpected reset
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring.
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC 61967-1 standard, which specifies the general conditions for EMI measurements after extract microprocessor spc5602df1v1 flash data.
Table 32. EMI radiated emission measurement1 2
| Symbol | C | Parameter | Conditions | Value | Unit | ||||
| Min | Typ | Max | |||||||
| — | SR | — | Scan range | — | 0.150 | — | 1000 | MHz | |
| fCPU | SR | — | Operating frequency | — | — | 48 | — | MHz | |
| VDD_LV | SR | — | LV operating voltages | — | — | 1.28 | — | V | |
| SEMI | CC | T | Peak level | VDD = 5 V, TA = 25 °C, 100 LQFP package Test conforming to IEC 61967-2, fOSC = 8 MHz/fCPU = 48 MHz | No PLL frequency modulation | — | — | 18 | dBµ V |
| ± 2% PLL frequency modulation | — | — | 14 | dBµ V |
- EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
- For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your local marketing representative.